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2024 New Quality Productivity and Power Semiconductor Annual Conference
Summary:

From October 28 to 29, 2024, Shanghai Jiading welcomed the highly anticipated 2024 New Quality Productivity and Power Semiconductor Annual Conference. With the theme of "Pursuing Quality and Creating ...

From October 28 to 29, 2024, Shanghai Jiading welcomed the highly anticipated 2024 New Quality Productivity and Power Semiconductor Annual Conference. With the theme of "Pursuing Quality and Creating Cores, Creating the Future with Intelligence", this annual conference brought together top experts, industry leaders and innovative enterprise representatives from around the world to discuss the latest developments, market trends, application challenges and future opportunities of power semiconductor technology.

SIC Power Semiconductor Device Dynamic Reliability Test System

As an important part of the semiconductor industry, power semiconductor devices play a vital role in modern electronic devices, new energy vehicles, smart grids and other fields. With the rise of third-generation semiconductor materials such as silicon carbide (SiC), the performance and reliability of power semiconductor devices have been significantly improved, but at the same time, new testing and evaluation challenges have been brought about. This annual conference is held to solve these challenges and promote industry progress.

SIC Power Semiconductor Device Dynamic Reliability Test System

During the annual conference, Kingcable made a stunning appearance with its third-generation power semiconductor device dynamic reliability test system, which, with its excellent test performance, provided strong support for the reliability evaluation of third-generation semiconductor materials, the reliability design of devices, and test methods and standards.

SIC Power Semiconductor Device Dynamic Reliability Test System

Kingcable has been committed to the research and development and manufacturing of semiconductor test equipment. The third-generation power semiconductor device dynamic reliability test system is the result of its many years of technological accumulation and innovative spirit. The system can simulate a variety of complex working conditions and conduct long-term, high-load dynamic reliability tests on SiC devices, thereby accurately evaluating the performance and life of the device in actual applications, greatly improving test efficiency and data accuracy, and providing strong technical support for the research and development and production of devices

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